Previous Editors
Dr. Hee-Kap Ahn, Postech, Korea, Republic of
Dr. Nancy M. Amato, Texas A&M University, United States
Dr. Lars Arge, University of Aarhus, Denmark
Prof. Erik D. Demaine, MIT, United States
Dr. Tamal K. Dey, The Ohio State University, United States
Dr. Hazel Everett, Université Nancy, France
Dr. Xavier Goaoc, INRIA, France
Dan Halperin, Tel Aviv University, Israel
Ferran Hurtado, Universitat Politècnica de Catalunya, Spain
ISSN: 1920-180X